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Table 1 Physical-chemical characterization of CeO2, SiO2 and CuO particles

From: Metabolomic effects of CeO2, SiO2 and CuO metal oxide nanomaterials on HepG2 cells

ID

Chemical

Vendor

Cat No.

Lot number

Primary particle size (nm)

TEM particle size (nm)

SEM aggregate Size (um)

Surface area (m2/g)

Diameter by BET (nm)

FTIR

Elements by SEM-EDX

Elements by TEM-EDX

Form by XRD

Assayer

CeO2 W4

CeO2

Nano-oxides

10-025

68740

15 by BET

  

55

15

    

Nano-oxides

 

20–50

1–3

52.8

14.9

-OH, Ce-O

Ce, O, Al

Ce, O, Al, Ti, Si

crystalline

University of Kentucky

CeO2 X5

CeO2

Nano-oxides

10-025-3

67722

200 by BET

  

5–9

200

    

Nano-oxides

 

5–20

1–5

20.8

38.1

-OH, Ce-O

Ce, O

Ce, O

crystalline

University of Kentucky

CeO2 Y6

CeO2

Aldrich

544841

67722

<25 by BET

        

Aldrich

 

5–20

1–20

40.3

19.5

-OH, Ce-O

Ce, O

Ce, O

crystalline

University of Kentucky

CeO2 Z7

CeO2

Alfa aesar

44960

J06 U027

15–30

  

30–50

     

Alfa aesar

 

5–20

1–5

57.0

13.8

-OH, Ce-O

Ce, O

Ce, O

crystalline

University of Kentucky

CeO2 Q

CeO2

Sigma Aldrich

211575

NM-213

<5000

>500

0.615

3.73

213

    

Geraets et al. [26]

 

NDa

ND

ND

ND

ND

ND

ND

ND

University of Kentucky

SiO2 J0

SiO2

US Research Nanomaterials

US3438

None

20–30

        

US Research Nanomaterials

 

10–30

1–10

137.4

16.5

-OH, Si-O

Si, O

Si, O

amorphorus

University of Kentucky

SiO2 K1

SiO2

ALDb

NAc

None

20–30

        

US Research Nanomaterials

 

10–30

1–10

128.8

17.6

-OH, Si-O

Si, O

Si, O

amorphorus

University of Kentucky

SiO2 N2

SiO2

ALDb

NAc

None

20–30

        

US Research Nanomaterials

 

10–30

1–10

120.5

18.8

-OH, Si-O

Si, O

Si, O

amorphorus

University of Kentucky

CuO

CuO

Nanostruct-ured and Amorphous Materials

2110FY

US3438

47

        

Nanostructured and Amorphous Materials

 

20–80

1–3

10.8

88.

-OH

Cu, O

Cu, O

crystalline

University of Kentucky

  1. Abbreviations: TEM transmission electron microscopy, SEM scanning electron microscopy, BET surface area/porosity determination by the Brunauer, Emmett, Teller test method, FTIR Fourier transform infrared spectroscopy, EDX energy-dispersive x-ray analysis, XRD X-ray diffraction
  2. aNot done
  3. bAtomic layer deposition on SiO2
  4. cNot available